Interlaboratory Nanoamp Current Comparison With...

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Interlaboratory Nanoamp Current Comparison With Subpart-Per-Million Uncertainty

Giblin, Stephen P., Drung, Dietmar, Gotz, Martin, Scherer, Hansjorg
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Year:
2019
Journal:
IEEE Transactions on Instrumentation and Measurement
DOI:
10.1109/TIM.2018.2879126
File:
PDF, 7 KB
2019
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