[IEEE 2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Reno, NV (2018.9.23-2018.9.28)] 2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Analysis of forward recovery in GGNMOS devices under fast transients

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