[IEEE 2018 IEEE International Reliability Physics Symposium (IRPS) - Burlingame, CA (2018.3.11-2018.3.15)] 2018 IEEE International Reliability Physics Symposium (IRPS) - Electromigration failure rate of redundant via
Ahn, Jae-Gyung, Yeh, Ping-Chin, Chang, JonathanYear:
2018
DOI:
10.1109/IRPS.2018.8353671
File:
PDF, 6 KB
2018