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[IEEE 2018 15th International Conference on Ubiquitous Robots (UR) - Honolulu, HI, USA (2018.6.26-2018.6.30)] 2018 15th International Conference on Ubiquitous Robots (UR) - Research on Fault Diagnosis of Rotational Automaton Based on VMD-ELM
Mingzhi, First A. Pan, Hongxia, Pan, Xin, Second B. Xu, Huiling, LiuYear:
2018
Language:
english
DOI:
10.1109/urai.2018.8441863
File:
PDF, 7 KB
english, 2018