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Accuracy of Measurements in Stereoscopic Observation by Using Transmission Electron Microscope
Niwa, Takafumi, Ikematsu, Yoichi, Taniyama, Akira, Shindo, DaisukeVolume:
67
Year:
2003
Language:
english
DOI:
10.2320/jinstmet1952.67.2_93
File:
PDF, 1014 KB
english, 2003