Experimental verification of the low transmission loss of a...

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IEEE Electron Device Letters 2019

Experimental verification of the low transmission loss of a flat-roofed sine waveguide slow-wave structure

Fang, Shuanzhu, Xu, Jin, Yin, Hairong, Lei, Xia, Jiang, Xuebing, Yin, Pengcheng, Wu, Gangxiong, Yang, Ruichao, Li, Qian, Guo, Guo, Yue, Lingna, Zhao, Guoqing, Wang, Wenxiang, Xu, Xiong, Shen, Fei, Wei
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Year:
2019
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2019.2904080
File:
PDF, 497 KB
2019
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