[IEEE 2018 IEEE 13th Nanotechnology Materials and Devices...

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[IEEE 2018 IEEE 13th Nanotechnology Materials and Devices Conference (NMDC) - Portland, OR (2018.10.14-2018.10.17)] 2018 IEEE 13th Nanotechnology Materials and Devices Conference (NMDC) - Methodology for Analysis of Electrical Breakdown In Micrometer gaps in Tip-To-Plane Configuration

Tofani, Kemas M, Sinisuka, Ngapuli I., Cambronne, Jean-Pascal, Makasheva, Kremena, Dinculescu, Sorin
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Year:
2018
DOI:
10.1109/NMDC.2018.8605855
File:
PDF, 1.03 MB
2018
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