[IEEE 2018 IEEE 13th Nanotechnology Materials and Devices Conference (NMDC) - Portland, OR (2018.10.14-2018.10.17)] 2018 IEEE 13th Nanotechnology Materials and Devices Conference (NMDC) - Methodology for Analysis of Electrical Breakdown In Micrometer gaps in Tip-To-Plane Configuration
Tofani, Kemas M, Sinisuka, Ngapuli I., Cambronne, Jean-Pascal, Makasheva, Kremena, Dinculescu, SorinYear:
2018
DOI:
10.1109/NMDC.2018.8605855
File:
PDF, 1.03 MB
2018