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Journal of Electronic Testing 2019 / 3

A Unified Approach to Detect and Distinguish Hardware Trojans and Faults in SRAM-based FPGAs

Ranjbar, Omid, Bayat-Sarmadi, Siavash, Pooyan, Fatemeh, Asadi, Hossein
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Language:
english
Journal:
Journal of Electronic Testing
DOI:
10.1007/s10836-019-05783-2
Date:
March, 2019
File:
PDF, 6.34 MB
english, 2019
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