Low-cost Digital Test Solution for Symbol Error Detection...

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IEEE Transactions on Device and Materials Reliability 2019

Low-cost Digital Test Solution for Symbol Error Detection of RF ZigBee Transmitters

Vayssade, T., Azais, F., Latorre, L., Lefevre, F.
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Year:
2019
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/TDMR.2019.2898769
File:
PDF, 8 KB
english, 2019
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