Reliability of 3D memories using Orthogonal Latin Square...

Microelectronics Reliability 2019 / 04 Vol. 95

Reliability of 3D memories using Orthogonal Latin Square codes

Sánchez-Macián, A., Garcia-Herrero, F., Maestro, J.A.
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Volume:
95
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2019.03.001
Date:
April, 2019
File:
PDF, 617 KB
2019
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