Deep and persistent spectral holes in thulium-doped yttrium orthosilicate for imaging applications
Venet, C., Car, B., Veissier, L., Ramaz, F., Louchet-Chauvet, A.Volume:
99
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.99.115102
Date:
March, 2019
File:
PDF, 1.66 MB
english, 2019