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[IEEE 2018 International SoC Design Conference (ISOCC) - Daegu, Korea (South) (2018.11.12-2018.11.15)] 2018 International SoC Design Conference (ISOCC) - A Radiation Hardened SRAM with Self-refresh and Compact Error Correction
Siddiqui, Sultan M., Sharma, Ruchi, Le, Van Loi, Yoo, Taegeun, Chang, Ik-Joon, Kim, Tony Tae-HyoungYear:
2018
DOI:
10.1109/ISOCC.2018.8649889
File:
PDF, 6 KB
2018