Influence of Microwave Probes on Calibrated On-Wafer...

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IEEE Transactions on Microwave Theory and Techniques 2019

Influence of Microwave Probes on Calibrated On-Wafer Measurements

Phung, Gia Ngoc, Schmuckle, Franz Josef, Doerner, Ralf, Kahne, Bernhard, Fritzsch, Thomas, Arz, Uwe, Heinrich, Wolfgang
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Year:
2019
Journal:
IEEE Transactions on Microwave Theory and Techniques
DOI:
10.1109/TMTT.2019.2903400
File:
PDF, 4.07 MB
2019
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