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[AIP The ninth international symposium on nondestructive characterization of materials - Sydney (Australia) (28 Jun-2 Jul 1999)] AIP Conference Proceedings - Wide angle X-ray diffraction topography of polycrystalline materials
Hentschel, Manfred P., Lange, Axel, Schors, Joerg, Wald, Oliver, Harbich, Karl-WolframYear:
1999
DOI:
10.1063/1.1302070
File:
PDF, 2.80 MB
1999