Investigation and active suppression of self-heating...

Chinese Physics B 2019 / 01 Vol. 28; Iss. 1

Investigation and active suppression of self-heating induced degradation in amorphous InGaZnO thin film transistors

Zhang, Dong, Wu, Chenfei, Xu, Weizong, Ren, Fangfang, Zhou, Dong, Yu, Peng, Zhang, Rong, Zheng, Youdou, Lu, Hai
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Volume:
28
Journal:
Chinese Physics B
DOI:
10.1088/1674-1056/28/1/017303
Date:
January, 2019
File:
PDF, 441 KB
2019
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