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[IEEE 2019 IEEE 26th International Conference on Software Analysis, Evolution and Reengineering (SANER) - Hangzhou, China (2019.2.24-2019.2.27)] 2019 IEEE 26th International Conference on Software Analysis, Evolution and Reengineering (SANER) - DeepCT: Tomographic Combinatorial Testing for Deep Learning Systems
Ma, Lei, Juefei-Xu, Felix, Xue, Minhui, Li, Bo, Li, Li, Liu, Yang, Zhao, JianjunYear:
2019
DOI:
10.1109/SANER.2019.8668044
File:
PDF, 414 KB
2019