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Microscopy and Microanalysis 2019 / 2

Statistically Rigorous Silver Nanowire Diameter Distribution Quantification by Automated Electron Microscopy and Image Analysis

Todd, Clifford S., Heeschen, William A., Eastman, Peter Y., Keene, Ellen C.
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Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927619000047
Date:
February, 2019
File:
PDF, 608 KB
english, 2019
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