Penetration depth of shielding currents due to crossed magnetic fields in bulk (RE)-Ba-Cu-O superconductors
Srpčič, J, Perez, F, Huang, K Y, Shi, Y, Ainslie, M D, Dennis, A R, Filipenko, M, Boll, M, Cardwell, D A, Durrell, J HVolume:
32
Journal:
Superconductor Science and Technology
DOI:
10.1088/1361-6668/aafcd3
Date:
March, 2019
File:
PDF, 1.49 MB
2019