Improving Combinational Circuit Reliability against...

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IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 2019

Improving Combinational Circuit Reliability against Multiple Event Transients via a Partition and Restructuring Approach

Rohanipoor, Mohammad Reza, Ghavami, Behnam, Raji, Mohsen
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Year:
2019
Journal:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
DOI:
10.1109/TCAD.2019.2907922
File:
PDF, 2.17 MB
2019
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