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In vitro dissolution behavior of hydrogenated amorphous silicon thin-film transistors
Tian, Yuan, Flewitt, Andrew J., Canham, Leigh T., Coffer, Jeffery L.Volume:
2
Language:
english
Journal:
npj Materials Degradation
DOI:
10.1038/s41529-018-0063-0
Date:
December, 2018
File:
PDF, 2.35 MB
english, 2018