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[IEEE TENCON 2018 - 2018 IEEE Region 10 Conference - Jeju, Korea (South) (2018.10.28-2018.10.31)] TENCON 2018 - 2018 IEEE Region 10 Conference - Impact of Gate Underlap Design on Analog and RF Performance for 20nm Tri-Material Double Gate(TMDG) MOSFET
Rahman, Md. Sazzadur, Ahmed, NabilYear:
2018
Language:
english
DOI:
10.1109/TENCON.2018.8650197
File:
PDF, 3.14 MB
english, 2018