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[IEEE 2018 IEEE International Ultrasonics Symposium (IUS) - Kobe (2018.10.22-2018.10.25)] 2018 IEEE International Ultrasonics Symposium (IUS) - Leaky SAW Devices with Beryllium Electrodes
Plessky, Victor, Koskela, Julius, Hammond, RobertYear:
2018
DOI:
10.1109/ULTSYM.2018.8580172
File:
PDF, 488 KB
2018