[IEEE 2018 IEEE Nanotechnology Symposium (ANTS) - Albany,...

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[IEEE 2018 IEEE Nanotechnology Symposium (ANTS) - Albany, NY, USA (2018.11.14-2018.11.15)] 2018 IEEE Nanotechnology Symposium (ANTS) - Characterization of N type Si doped ZnO and ZnO thin films deposited by RF magnetron sputtering

Claypoole, Jesse, Altwerger, Mark, Flottman, Spencer, Efstathiadis, Harry
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Year:
2018
Language:
english
DOI:
10.1109/NANOTECH.2018.8653571
File:
PDF, 480 KB
english, 2018
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