Modeling the dependence of single event transients on...

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IEEE Transactions on Nuclear Science 2019

Modeling the dependence of single event transients on strike location for circuit-level simulation

Ding, Lili, Chen, Wei, Wang, Tan, Chen, Rongmei, Luo, Yinhong, Zhang, Fengqi, Pan, Xiaoyu, Sun, Huabo, Chen, Lei
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Year:
2019
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2019.2904716
File:
PDF, 373 KB
english, 2019
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