Correction of Scanning Electron Microscope Imaging Artifacts in a Novel Digital Image Correlation Framework
Maraghechi, S., Hoefnagels, J. P. M., Peerlings, R. H. J., Rokoš, O., Geers, M. G. D.Language:
english
Journal:
Experimental Mechanics
DOI:
10.1007/s11340-018-00469-w
Date:
March, 2019
File:
PDF, 8.52 MB
english, 2019