[IEEE 2018 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) - Burlingame, CA, USA (2018.10.15-2018.10.18)] 2018 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) - A highly sensitive photodetector based on deepdepletion effects in SOI transistors

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