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[IEEE 2018 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) - Burlingame, CA, USA (2018.10.15-2018.10.18)] 2018 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) - A highly sensitive photodetector based on deepdepletion effects in SOI transistors
Arsalan, M., Cao, XY., Lu, BR., Chen, YF., Zaslavsky, A., Cristoloveanu, S., Bawedin, M., Wan, J.Year:
2018
Language:
english
DOI:
10.1109/S3S.2018.8640150
File:
PDF, 530 KB
english, 2018