Investigation and active suppression of self-heating induced degradation in amorphous InGaZnO thin film transistors
Zhang, Dong, Wu, Chenfei, Xu, Weizong, Ren, Fangfang, Zhou, Dong, Yu, Peng, Zhang, Rong, Zheng, Youdou, Lu, HaiVolume:
28
Language:
english
Journal:
Chinese Physics B
DOI:
10.1088/1674-1056/28/1/017303
Date:
January, 2019
File:
PDF, 441 KB
english, 2019