Annealing of FIB-Induced Defects in GaAs/AlGaAs...

Semiconductors 2018 / 12 Vol. 52; Iss. 14

Annealing of FIB-Induced Defects in GaAs/AlGaAs Heterostructure

Levitskii, I. V., Mitrofanov, M. I., Voznyuk, G. V., Nikolaev, D. N., Mizerov, M. N., Evtikhiev, V. P.
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Volume:
52
Language:
english
Journal:
Semiconductors
DOI:
10.1134/s1063782618140178
Date:
December, 2018
File:
PDF, 830 KB
english, 2018
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