Characterization and Modeling of 28-nm FDSOI CMOS...

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Solid-State Electronics 2019 / 3

Characterization and Modeling of 28-nm FDSOI CMOS Technology down to Cryogenic Temperatures

Beckers, Arnout, Jazaeri, Farzan, Bohuslavskyi, Heorhii, Hutin, Louis, De Franceschi, Silvano, Enz, Christian
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Language:
english
Journal:
Solid-State Electronics
DOI:
10.1016/j.sse.2019.03.033
Date:
March, 2019
File:
PDF, 5.69 MB
english, 2019
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