Characterization of the Interface-Driven 1st Reset...

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Solid-State Electronics 2019 / 3

Characterization of the Interface-Driven 1st Reset Operation in HfO2-based 1T1R RRAM Devices

Pérez, Eduardo, Mahadevaiah, Mamathamba Kalishettyhalli, Zambelli, Cristian, Olivo, Piero, Wenger, Christian
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Language:
english
Journal:
Solid-State Electronics
DOI:
10.1016/j.sse.2019.03.054
Date:
March, 2019
File:
PDF, 4.23 MB
english, 2019
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