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IEEE Electron Device Letters 2019

Low loss Si-substrates enhanced using buried PN junctions for RF applications

Rack, M., Nyssens, L., Raskin, J.-P.
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Year:
2019
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2019.2908259
File:
PDF, 1.35 MB
english, 2019
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