[IEEE 2018 International Symposium on Semiconductor...

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[IEEE 2018 International Symposium on Semiconductor Manufacturing (ISSM) - Tokyo, Japan (2018.12.10-2018.12.11)] 2018 International Symposium on Semiconductor Manufacturing (ISSM) - Process Control Technique to Reduce Wafer Warpage for Trench Field Plate Power MOSFET

Kato, Hiroaki, Kobayashi, Kenya, Nishiguchi, Toshifumi, Shimomura, Saya
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Year:
2018
Language:
english
DOI:
10.1109/issm.2018.8651148
File:
PDF, 356 KB
english, 2018
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