Insertion Layer Thickness Dependence of Magnetic and Electrical Properties for Double-CoFeB/MgO-Interface Magnetic Tunnel Junctions
Miura, S., Nguyen, T. V. A., Endo, Y., Sato, H., Ikeda, S., Nishioka, K., Honjo, H., Endoh, T.Year:
2019
Language:
english
Journal:
IEEE Transactions on Magnetics
DOI:
10.1109/TMAG.2019.2901841
File:
PDF, 669 KB
english, 2019