Visualization of Charge Carrier Trapping in Silicon at the...

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The Journal of Physical Chemistry Letters 2019 / 04

Visualization of Charge Carrier Trapping in Silicon at the Atomic Surface Level Using 4D Electron Imaging

Mohammed, Omar F., Shaheen, Basamat S., El-Zohry, Ahmed M., Yin, Jun, De Bastiani, Michele, De Wolf, Stefaan, Bakr, Osman M.
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Language:
english
Journal:
The Journal of Physical Chemistry Letters
DOI:
10.1021/acs.jpclett.9b00598
Date:
April, 2019
File:
PDF, 1.45 MB
english, 2019
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