[IEEE 2018 17th IEEE International Conference on Machine Learning and Applications (ICMLA) - Orlando, FL (2018.12.17-2018.12.20)] 2018 17th IEEE International Conference on Machine Learning and Applications (ICMLA) - A Comparison of Supervised Approaches for Process Pattern Recognition in Analog Semiconductor Wafer Test Data
Schrunner, Stefan, Bluder, Olivia, Zernig, Anja, Kaestner, Andre, Kern, RomanYear:
2018
Language:
english
DOI:
10.1109/ICMLA.2018.00131
File:
PDF, 222 KB
english, 2018