Suppression of Filament Overgrowth in Conductive Bridge...

Nanoscale Research Letters 2019 / 12 Vol. 14; Iss. 1

Suppression of Filament Overgrowth in Conductive Bridge Random Access Memory by Ta2O5/TaOx Bi-Layer Structure

Yu, Jie, Xu, Xiaoxin, Gong, Tiancheng, Luo, Qing, Dong, Danian, Yuan, Peng, Tai, Lu, Yin, Jiahao, Zhu, Xi, Wu, Xiulong, Lv, Hangbing, Liu, Ming
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Volume:
14
Language:
english
Journal:
Nanoscale Research Letters
DOI:
10.1186/s11671-019-2942-x
Date:
December, 2019
File:
PDF, 2.41 MB
english, 2019
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