Improving the SNR of Atomic Resolution STEM EELS & EDX Mapping while Reducing Beam-damage by using Non-rigid Spectrum-image Averaging
Jones, Lewys, Beanland, Richard, Lozano-Perez, Sergio, Baba-kishi, Karim, Nellist, Peter D.Volume:
21
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927615006868
Date:
August, 2015
File:
PDF, 381 KB
2015