![](/img/cover-not-exists.png)
Carrier lifetime measurements from transient electrical photoresponses
Bielle-Daspet, D.M., Johan, A.M., Espioussas, F.Volume:
15
Year:
1980
Journal:
Revue de Physique Appliquée
DOI:
10.1051/rphysap:01980001502021900
File:
PDF, 1.76 MB
1980