Thermoreflectance profile analysis and multiparameter 3D fitting model applied to the measurement of thermal parameters of thin film materials
Badine, Elie, Bardoux, Mathieux, Abboud, Nadine, Depriester, Michael, Longuemart, Stéphane, Herro, Ziad, Hadj Sahraoui, AbdelhakVolume:
52
Language:
english
Journal:
Journal of Physics D: Applied Physics
DOI:
10.1088/1361-6463/ab0ac7
Date:
May, 2019
File:
PDF, 1020 KB
english, 2019