Characterization of dielectric function for metallic thin films based on ellipsometric parameters and reflectivity
Liu, Jiamin, Lin, Jianbin, Jiang, Hao, Gu, Honggang, Chen, Xiuguo, Zhang, Chuanwei, Liao, Guanglan, Liu, ShiyuanLanguage:
english
Journal:
Physica Scripta
DOI:
10.1088/1402-4896/ab1606
Date:
April, 2019
File:
PDF, 1.75 MB
english, 2019