Investigation of resistive switching in SiO...

Journal of Physics Conference Series 2019 / 03 Vol. 1186

Investigation of resistive switching in SiO 2 layers with Si nanocrystals

Manolov, E, Paz-Delgadillo, J, Dzhurkov, V, Nedev, N, Nesheva, D, Curiel-Alvarez, M, Valdez-Salas, B
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Volume:
1186
Language:
english
Journal:
Journal of Physics: Conference Series
DOI:
10.1088/1742-6596/1186/1/012022
Date:
March, 2019
File:
PDF, 609 KB
english, 2019
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