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[IEEE 2018 IEEE International Conference on Advanced Manufacturing (ICAM) - Yunlin (2018.11.16-2018.11.18)] 2018 IEEE International Conference on Advanced Manufacturing (ICAM) - Diagnosis of heavy metal cross contamination in leaf of rice based on hyperspectral image: a greenhouse experiment
Zhang, Shuang-Yin, Fei, Teng, Ran, Yan-HongYear:
2018
Language:
english
DOI:
10.1109/AMCON.2018.8614938
File:
PDF, 624 KB
english, 2018