A Comprehensive Framework for Parametric Failure Modeling and Yield Analysis of STT-MRAM
Nair, Sarath Mohanachandran, Bishnoi, Rajendra, Tahoori, Mehdi B.Year:
2019
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/TVLSI.2019.2904197
File:
PDF, 3.21 MB
english, 2019