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Approach to Defect-Free Lifetime and High Electron Density in CdTe
Swain, S. K., Duenow, J. N., Johnston, S. W., Amarasinghe, M., McCoy, J. J., Metzger, W. K., Lynn, K. G.Language:
english
Journal:
Journal of Electronic Materials
DOI:
10.1007/s11664-019-07190-x
Date:
April, 2019
File:
PDF, 1.26 MB
english, 2019