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Microstructural Characterization by Automated Crystal Orientation and Phase Mapping by Precession Electron Diffraction in TEM: Application to Hot Deformation of a γ-TiAl-based Alloy

Singh, Vajinder, Mondal, Chandan, Bhattacharjee, P. P., Ghosal, P.
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Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927619000394
Date:
April, 2019
File:
PDF, 1.89 MB
english, 2019
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