AIP Conference Proceedings [AIP THE 10TH INTERNATIONAL CONFERENCE ON X-RAY MICROSCOPY - Chicago, Illinois, (USA) (15–20 August 2010)] - The Soft X-ray Spectromicroscopy Beamline at SSRF
Guo, Z., Tai, R., Wand, Y., Yan, R., Chen, M., Wu, Y., Chen, J., Xue, S., Xu, H., McNulty, Ian, Eyberger, Catherine, Lai, BarryYear:
2011
Language:
english
DOI:
10.1063/1.3625330
File:
PDF, 1.15 MB
english, 2011