[IEEE 2019 IEEE Conference of Russian Young Researchers in...

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[IEEE 2019 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus) - Saint Petersburg and Moscow, Russia (2019.1.28-2019.1.31)] 2019 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus) - The Effect of Ion Beam Etching on Mechanical Strength Multilayer Aluminum Membranes

Gusev, Evgeney E., Borisova, Anna V., Dedkova, Anna A., Salnikov, Anton A., Kireev, Valeri Yu.
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Year:
2019
Language:
english
DOI:
10.1109/EIConRus.2019.8657243
File:
PDF, 23 KB
english, 2019
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