Nanorobotic Manipulation System for 360° Characterization...

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IEEE Transactions on Industrial Electronics 2019

Nanorobotic Manipulation System for 360° Characterization Atomic Force Microscopy

Wen, Yongbing, Lu, Haojian, Shen, Yajing, Xie, Hui
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Year:
2019
Language:
english
Journal:
IEEE Transactions on Industrial Electronics
DOI:
10.1109/TIE.2019.2910042
File:
PDF, 8 KB
english, 2019
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