[IEEE 2019 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus) - Saint Petersburg and Moscow, Russia (2019.1.28-2019.1.31)] 2019 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus) - Testing of the Fault Tolerant Element
Grekov, Artem V., Tyurin, Sergey F.Year:
2019
DOI:
10.1109/EIConRus.2019.8656730
File:
PDF, 191 KB
2019