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Beam brightness and its reduction in a 1.2-MV cold field-emission transmission electron microscope
Kawasaki, Takeshi, Akashi, Tetsuya, Kasuya, Keigo, Shinada, HiroyukiVolume:
202
Language:
english
Journal:
Ultramicroscopy
DOI:
10.1016/j.ultramic.2019.04.002
Date:
July, 2019
File:
PDF, 1.53 MB
english, 2019